Microscopes
Technical Data Observation image:
Erect image
Optical tube:
Siedentopf type (pupil distance adjustment: 51 - 76mm), 1X tube lens, Binocular tube (depression: 30˚), Reticle projection method, with TV mount, Optical path ratio (eyepiece/TV mount: 50/50)
MF-U SERIES 176 — High-power Multi-function Measuring Microscopes
Eyepiece lens:
10X (field No.: 24mm), Optional: 15X, 20X
Turret (optional): Objective (optional): to 200X Transmitted illumination • Light source:
Manual or power
• Observation with a clear and flareless erect image and a wide field of view • Measuring accuracy that is highest in its class (and conforms to JIS B 7153) • Proven high-NA objectives from the FS optical system (long-working distance type) • Integration of metallurgical and measurement microscope functions provides high-resolution observation and high-accuracy measurement solution • Illumination unit (reflected/transmitted) selectable from a high-intensity LED or halogen bulb (required) • Variable aperture diaphragm (reflected/ transmitted) allows for contrast adjustment • Variety of standardized stages in sizes up to 400 × 200 mm • Quick-release mechanism useful for moving the stage quickly when measuring workpieces that are large in size or quantity • High-magnification eyepiece observation up to 4000X
M / BD Plan Apo objective from 1X
Halogen bulb (12V, 50W) or LED Telecentric illumination with adjustable aperture diaphragms Light intensity adjustable, Non- stepped brightness adjustment Optional halogen illumination unit (fiber-optic cold light illumination) or LED Koehler illumination with adjustable aperture diaphragms Light intensity adjustable, Non- stepped brightness adjustment .0001” / .00005” / .00001” / 0.001mm / 0.0005mm / 0.0001mm Zero-setting, Direction switching, Data output (via RS-232C interface) 148lbs/67kg (1010D) / 157lbs/71kg (2010D) / 326lbs/148kg (2017D) / 344lbs/156kg (3017D) / 357lbs/162kg (4020D) 120V AC, 50/60Hz 2 axes or 3 axes
• Optical system:
• Functions:
Surface illumination • Light source:
• Optical system:
• Functions:
Display unit:
• No. of axis: • Resolution:
• Functions:
Power supply:
Mass:
MF-UB3017D XY stage travel range: 12 x 6.7” / 300 x 170mm (with optional turret, objective and fiber illumination)
Selection of XY stage by travel range
1010D : 4 x 4” / 100 x 100mm
180
25 70 25 220
250
280
2010D : 8 x 4” / 200 x 100mm
I
25 70
25
350 290 220
270
2017D : 8 x 6.7” / 200 x 170mm
Differential interference contrast (DIC) observation: Effective in detecting fine scratches and steps on the surface of metal, liquid crystal, and semiconductors.
Polarized light observation: Observing only the filtered light that vibrates in one direction. Used for observing materials with special optical characteristics, such as mineral and liquid crystal.
220 25 25 70
350
292
370
410
3017D : 12 x 6.6” / 300 x 170mm
450 220 25 25 70
342
510
Dark field (DF) observation: Observing only the scattered light by shutting down the direct light to the objectives. The scratches and dust that cannot be viewed in the bright view field can be observed by this method in high-contrast.
Bright field (BF) observation: Most common method of observation. Observing directly the light reflected from the surface of the workpiece.
440
4020D : 16” x 8” / 400 x 200mm
520 220 25 25 70
392
610
I-21
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